Timeline for For sufficiently low duty cycle, can you get away with driving SCR above rated current as long as A^2 * s are maintained?
Current License: CC BY-SA 4.0
8 events
| when toggle format | what | by | license | comment | |
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| Apr 28, 2023 at 4:15 | comment | added | John D | @JamesStrieter Sure, common knowledge. But if it’s not in the datasheet you won’t know if your circuit will work or be reliable. Second breakdown in BJTs caused a lot of problems for people who thought they could get away with excursions of voltage/current in the early days of solid state electronics. So you MIGHT be OK. | |
| Apr 28, 2023 at 0:49 | vote | accept | James Strieter | ||
| Apr 27, 2023 at 23:55 | comment | added | periblepsis | @James You may want to look up "specific action integral." | |
| Apr 27, 2023 at 23:31 | answer | added | Tim Williams | timeline score: 2 | |
| Apr 27, 2023 at 22:55 | comment | added | RussellH | There is no rule. If you exceed the ratings in the data sheet you are on your own. All you can do is test and hope for the best. | |
| Apr 27, 2023 at 22:03 | comment | added | James Strieter | @JohnD it's common knowledge that you can exceed the RMS rating of a device for short bursts. I'm looking for a rule to calculate how short a pulse needs to be for the device to survive a given current. | |
| Apr 27, 2023 at 21:18 | comment | added | John D | No, you have to stay within datasheet limits. There are things like current crowding on the die that can cause failures even though the I^2t is the same. If it's not specified on the datasheet you're on your own. | |
| Apr 27, 2023 at 21:00 | history | asked | James Strieter | CC BY-SA 4.0 |