A convolutional model for estimating the junction temperatures of SiC MOSFET transistors
Authors:
Ali El Arabi,
Denis Maillet,
Nicolas Blet,
Benjamin Remy
Abstract:
The junction temperature is a very important parameter for monitoring power electronics converters based on MOSFET transistors. They offer the possibility of switching at relatively higher frequencies than other transistors like IGTBTs. However, the electrical parameters of MOSFETs are highly thermally dependent. The thermo-dependence of MOSFET electrical parameters is rarely taken into considerat…
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The junction temperature is a very important parameter for monitoring power electronics converters based on MOSFET transistors. They offer the possibility of switching at relatively higher frequencies than other transistors like IGTBTs. However, the electrical parameters of MOSFETs are highly thermally dependent. The thermo-dependence of MOSFET electrical parameters is rarely taken into consideration when implementing control strategies, for many technological reasons, such as the difficulty of measuring the junction temperature. In practice, the junction temperature of transistors is inaccessible for direct measurement. The presence of a gel covering the chips, that provides electrical and thermal insulation, makes measurement by infrared thermography impossible. Furthermore, direct thermocouple measurement cannot be implemented due to the electromagnetic disturbances in the environment. Several researchers have attempted to correlate chip temperature with thermosensitive electrical parameters. In the present work, a thermal convolutive model has been developed to estimate the junction temperatures of two MOSFET transistors belonging to the same electronic circuit from external temperature measurements in two well-chosen locations (far away enough from the junction to avoid electromagnetic interference), using also the measured power dissipated on each chip. The thermal coupling between the two transistors has been considered in the form of mutual transmittances. The model was first calibrated using three-dimensional numerical simulations in COMSOL Multiphysics, followed by an experimental study. The results are very promising, illustrating the robustness of the convolutional model.
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Submitted 1 July, 2024;
originally announced July 2024.
Denoising Score-Matching for Uncertainty Quantification in Inverse Problems
Authors:
Zaccharie Ramzi,
Benjamin Remy,
Francois Lanusse,
Jean-Luc Starck,
Philippe Ciuciu
Abstract:
Deep neural networks have proven extremely efficient at solving a wide rangeof inverse problems, but most often the uncertainty on the solution they provideis hard to quantify. In this work, we propose a generic Bayesian framework forsolving inverse problems, in which we limit the use of deep neural networks tolearning a prior distribution on the signals to recover. We adopt recent denoisingscore…
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Deep neural networks have proven extremely efficient at solving a wide rangeof inverse problems, but most often the uncertainty on the solution they provideis hard to quantify. In this work, we propose a generic Bayesian framework forsolving inverse problems, in which we limit the use of deep neural networks tolearning a prior distribution on the signals to recover. We adopt recent denoisingscore matching techniques to learn this prior from data, and subsequently use it aspart of an annealed Hamiltonian Monte-Carlo scheme to sample the full posteriorof image inverse problems. We apply this framework to Magnetic ResonanceImage (MRI) reconstruction and illustrate how this approach not only yields highquality reconstructions but can also be used to assess the uncertainty on particularfeatures of a reconstructed image.
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Submitted 16 November, 2020;
originally announced November 2020.
